Materials Explorer · Scientific record

Evidence-aware scientific record. Interpret measurements within their reported conditions.

OLED-M-0008

DMAC-TRZ

TADF sensitizer · donor-acceptor TADF emitter

M3 identity · Certified exact molecular graph

OLED-M-0008: owner-approved molecular artwork. Certified nonisotopic molecular graph. — Owner-approved artwork of certified nonisotopic graph.

Molecular identity and structural identifiers

Owner-certified exact nonisotopic molecular graph. Structural identifiers below are derived from and reconciled with the certified SDF.

Identity classification: Certified exact molecular graph
Molecular formula: C36H28N4 (exact nonisotopic graph)
Canonical isomeric SMILES: CC1(C)c2ccccc2N(c2ccc(-c3nc(-c4ccccc4)nc(-c4ccccc4)n3)cc2)c2ccccc21
Certified exact structure
InChIKey: IVXBGKPGZOETEW-UHFFFAOYSA-N
Certified source SDF SHA256: 593FAB90DCDDDA35E16FE4CED936EC4B435678AE3659F387798DD5F7CB4ABE39
Scientific certification: TRACKA_PREVIOUS_OWNER_CERTIFICATION
Identity evidence: M3 Ten_Material_Identity_Closure_v1.json; identity-only sidecar, not an RC2 numerical data change

4Experimental observations

1Device / application contexts

0Published calculated properties

1Primary sources

Experimental photophysics (4 records)

Every reported value retains its own host, medium, sample phase, temperature, method and locator. PL decay time is not OLED operational lifetime. Rows are not a cross-material ranking.

Property	Reported value	Medium / context	Source location & evidence
PLQY_film	98%	10 wt% DMAC-TRZ in mCBPCN (sensitizer only film); 90 wt% host Full measurement conditions temperature note Source specifies room temperature but not a precise numerical temperature in K. value kind AUTHOR_REPORTED method note N2 atmosphere; drop-cast film; excitation 355 nm as stated SI Table S₁. uncertainty Not reported host mCBPCN doping 10 wt% — basis: sensitizer or terminal-emitter wt% of overall film; remainder host measurement photoluminescence canonical parameter PLQY sample phase film determination class SOURCE_REPORTED_EXPERIMENTAL_OBSERVATION	Official SI printed S₅, Table S₁: DMAC-TRZ:mCBPCN 98% in N2 (also SI S₇ Table S₃) PRIMARY_REPORTED Source record / DOI ↗
PL_emission_peak_film	502 nm	10 wt% DMAC-TRZ in mCBPCN (sensitizer only film); 90 wt% host Full measurement conditions temperature note Source specifies room temperature but not a precise numerical temperature in K. value kind AUTHOR_REPORTED method note Steady-state PL in host; distinct from deconvoluted conformer features and HF blend peak. uncertainty Not reported host mCBPCN doping 10 wt% — basis: sensitizer or terminal-emitter wt% of overall film; remainder host measurement photoluminescence canonical parameter PL_PEAK sample phase film determination class SOURCE_REPORTED_EXPERIMENTAL_OBSERVATION	Official SI printed S₅, Table S₁: DMAC-TRZ:mCBPCN λmax 502 nm PRIMARY_REPORTED Source record / DOI ↗
prompt_PL_decay_time_film	21.66 ns	10 wt% DMAC-TRZ in mCBPCN (sensitizer only film); 90 wt% host Full measurement conditions temperature note Source specifies room temperature but not a precise numerical temperature in K. value kind AUTHOR_REPORTED method note Biexponential-amplitude weighted average; NOT the 15.55 ns HF blend component. uncertainty Not reported host mCBPCN doping 10 wt% — basis: sensitizer or terminal-emitter wt% of overall film; remainder host measurement photoluminescence canonical parameter TAU_PROMPT_PL sample phase film determination class AUTHOR_FITTED_EXPERIMENTAL_DECAY	Official SI printed S₅, Table S₁: DMAC-TRZ:mCBPCN τPF,av 21.66 ns PRIMARY_REPORTED Source record / DOI ↗
delayed_PL_decay_time_film	15.5 μs	10 wt% DMAC-TRZ in mCBPCN (sensitizer only film); 90 wt% host Full measurement conditions temperature note Source specifies room temperature but not a precise numerical temperature in K. value kind AUTHOR_REPORTED method note Multiexponential fit; delayed PL time, not operational device LT50. uncertainty Not reported host mCBPCN doping 10 wt% — basis: sensitizer or terminal-emitter wt% of overall film; remainder host measurement photoluminescence canonical parameter TAU_DELAYED_PL sample phase film determination class AUTHOR_FITTED_EXPERIMENTAL_DECAY	Official SI printed S₅, Table S₁: DMAC-TRZ:mCBPCN τDF,av 15.5 μs PRIMARY_REPORTED Source record / DOI ↗

OLED device and application evidence (1)

Device EQE, electroluminescence and lifetime refer to specified devices and operating conditions, not intrinsic constants of the emitter.

Device / application record 1 — As a 10 wt% mCBPCN sensitizer with ν-DABNA terminal emitter, source reports limited EQE enhancement relative to strong sensitizer-only OLEDs (main Fig. 4d); not material-intrinsic EQE.

Evidence trail:Source record / DOI ↗

Publisher main article Device section and Figure 4 (printed pp. 558-559); SI device and lifetime sections

reported context: As a 10 wt% mCBPCN sensitizer with ν-DABNA terminal emitter, source reports limited EQE enhancement relative to strong sensitizer-only OLEDs (main Fig. 4d); not material-intrinsic EQE.
primary source id: SRC-STAVROU-2024-NATPHOT
source locator: Publisher main article Device section and Figure 4 (printed pp. 558-559); SI device and lifetime sections
notebook status: SOURCE_LINKED_EDITORIAL_EVIDENCE_NOT_DEVICE_DATABASE_RECORD
limitation: Applies to a specific sensitizer/terminal-emitter co-doped OLED device, not an isolated molecular photophysical property. Device EQE and lifetime depend on full architecture, luminance and host. Direct claims of commercial readiness are not warranted.

Theoretical / calculated properties (0)

These are author-published model outputs, not independent experimental measurements. Compare only within compatible calculation methods, geometries and states.

No linked theoretical properties reported.

Primary scientific sources

Key requirements for ultraefficient sensitization in hyperfluorescence organic light-emitting diodes

Stavrou, Franca, Danos and Monkman · Nature Photonics · 2024

DOI 10.1038/s41566-024-01395-1

Source ID: SRC-STAVROU-2024-NATPHOT

ACRSA/DMAC-TRZ are sensitizers in 10wt% mCBPCN films; AZB-TRZ is sensitizer in 10wt% mCP; ν-DABNA terminal emitter 1wt% in mCBPCN vs mCP gives distinct PLQY. FRET efficiency is pair/film-system property, not intrinsic scalar material property. SI Table S₅ vs S₆ AZB-TRZ k_FRET conflict and SI Table S₆ AZB host heading ambiguity remain OPEN.

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Identity, evidence and limitations

Current M3 identity closure: Certified exact molecular graph.

Source discrepancies

Reported source discrepancy

Corresponding source record / DOI ↗ · Official SI printed S-8 Table S₅ and Table S₆

issue id: 2C-F002
source id: SRC-STAVROU-2024-NATPHOT
severity: MAJOR_FOR_FRET_REUSE
locator: Official SI printed S-8 Table S₅ and Table S₆
description: AZB-TRZ k_FRET is 3.75 × 10⁷ s⁻¹ in Table S₅ versus 2.46 × 10⁷ s⁻¹ in Table S₆; AZB host column heading in Table S₆ says mCBPCN although other listed AZB examples use mCP.
affected area: System-specific FRET data, excluded from intrinsic material observations
disposition: WITHHOLD_DISPUTED_FRET_DATA; AWAIT_AUTHOR_OR_SOURCE_RESOLUTION

Reported source discrepancy

Corresponding source record / DOI ↗ · Official SI printed S-7 Table S₂ versus S-8 Table S₄

issue id: 2C-F003
source id: SRC-STAVROU-2024-NATPHOT
severity: MINOR_SOURCE_INTERNAL
locator: Official SI printed S-7 Table S₂ versus S-8 Table S₄
description: AZB-TRZ PLQY in Table S₂ is 37.6%, whereas Table S₄ PhiPF=0.173 and PhiDF=0.194 sum to 36.7%. The data may reflect different determination procedures; source does not establish why.
affected area: Cross-table sum; published standalone PLQY 37.6% remains as source-reported, with caveat
disposition: PRESERVE_S2_37.6_PERCENT; DO_NOT_FORCE_RECONCILIATION

Displayed molecular artwork is tied to owner-approved files. Deuterated samples show only their certified nondeuterated parent skeleton.